Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Self-heating and traps effects on the drain transient response of AlGaN/GaN HEMTs

The channel temperature dependence of drain transient response in AlGaN/GaN HEMTs

Thermal analysis of multiple light sources based on the superposition method

Transient and long-term catastrophic optical damage in high power AlGaAs/GaAs laser diodes

Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography

Assessment of pulse conditions effects on reliability in GaN-based high electron mobility transistors by transient temperature measurements

The degradation and recovery properties of AlGaN/GaN high-electron mobility transistors under direct current reverse step voltage stress

The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique

Transient thermal characteristics related to catastrophic optical damage in high power AlGaAs/GaAs laser diodes

Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs

A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules

Degradation and recovery property of Schottky Barrier height of AlGaN/GaN high electron mobility transistors under reverse AC electrical stress

Determination of channel temperature for AlGaN/GaN HEMTs by high spectral resolution micro-Raman spectroscopy

Determination of Thermal Fatigue Delamination of Die Attach Materials for High-Brightness LEDs

Failure Mechanism of Phosphor Layer for High-Power GaN-Based White-LED

Quick screen of thermal resistance for batching high brightness LEDs

The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes

Thermal Fatigue Characteristics of Die Attach Materials for Packaged High-Brightness LEDs

Channel Temperature Measurement of AlGaN/GaN HEMTs by Forward Schottky Characteristics

Error correction of theory model in process-stress accelerated test

Error Correction of Theory Model in Process-Stress Accelerated Test

Evaluation of thermal resistance constitution for packaged AlGaN/GaN high electron mobility transistors by structure function method

Evaluation of VDMOS Storage Failure Rate Based on Accelerated Factor