Novel Semiconductor Devices and Reliability Lab
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Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars
2014
期刊
IEEE Transactions on Electron Devices
- 卷 61
- 期 8
- 页码 2854-2858
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9383
- DOI: 10.1109/ted.2014.2331333
