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Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Failure Mechanism of Phosphor Layer for High-Power GaN-Based White-LED

2012
期刊 Laser & Optoelectronics Progress
  • 卷 49
  • 期 10
  • 页码 102302
  • Shanghai Institute of Optics and Fine Mechanics
  • ISSN: 1006-4125
  • DOI: 10.3788/lop49.102302