Characterization of trap evolution in GaN-based HEMTs under pulsed stress

Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors under Reverse Pulse Electrical Stress Using the Voltage-Transient Method

A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

A thermal boundary resistance measurement method based on a designed chip with the heat source separated from the temperature sensor

A Trap Characterization System for GaN HEMTs Based on Transient Drain Voltage

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Evaluation of Trapping Behaviors in Forward Biased Schottky-Type p-GaN Gate HEMTs

FPGA-Based Implementation of Reverse Electrical Pulse Stress and Measurement system for Gallium Nitride High-Electron-Mobility Transistors

Investigation of trap characteristics under the inverse piezoelectric effect in AlGaN/GaN HEMT devices at room temperature and low temperature

Measurement Deviation of the Virtual Junction Temperature by the Saturation Voltage Drop Method for Insulated-Gate Bipolar Transistors

Measuring Double-Sided Thermal Resistance of Press-Pack IGBT Modules Based on Ratio of Double-Sided Heat Dissipation

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

Study of the temperature distribution in insulated gate bipolar transistor module under different test conditions

Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method

Trap characterization of GaN High-electron-mobility Transistors Based on the Transient Drain Voltage

Trap Characterization of Trench-Gate SiC MOSFETs based on Transient Drain Current

Characterization of hole traps in reverse-biased Schottky-type p-GaN gate HEMTs by current-transient method

Characterization of traps in GaN-based HEMTs by drain voltage transient and capacitance deep-level transient spectroscopy

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Effect of interface morphology on thermal contact resistance in thermal management of electronic devices

Experimental investigation on dipole and band offset affected by charge neutrality level modulation

Experimental study on the reliable working life of PUF chip for 8 years

Identification of Traps in p-GaN Gate HEMTs During OFF-State Stress by Current Transient Method

Implementation of Fast Measurement System of Semiconductor Device Parameter Temperature Coefficient Based on FPGA

Research on temperatures located within facet coating layers along z-axis of semiconductor lasers

Research on transient thermal behavior of semiconductor lasers under pulse current excitation by thermoreflection technique

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

Wake-up effect in Hf_0.4Zr_0.6O₂ ferroelectric thin-film capacitors under a cycling electric field

Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method