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Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs
2014
期刊
IEEE Electron Device Letters
- 卷 35
- 期 3
- 页码 345-347
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0741-3106
- DOI: 10.1109/led.2014.2300856
