Build-in compact and efficient temperature sensor array on field programmable gate array

Characterization of thermal-resistance in Ga2O3 Schottky barrier diodes with temperature-sensitive electrical parameters

Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET

Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method

Effects of temperature and bias voltage on electron transport properties in GaN highelectron-mobility transistors

Identifying the Properties of Traps in GaN High-Electron-Mobility Transistors via Amplitude Analysis Based on the Voltage-Transient Method

Low-cost reconfigurable temperature sensor array on field programmable gate array

Multi-physics field coupling simulation modeling and analysis of StakPak insulated gate bipolar transistor device

Nondestructive Measurement for Front Facet Temperature of Semiconductor Lasers

Non-destructive peak junction temperature measurement of double-chip IGBT modules with temperature inhomogeneity

Non-destructive testing of heteromorphic workpiece brazing layer quality based on heat conduction

Research on the Wake-up Effect of Ferroelectric HfO2-ZrO2 Thin Films

Study of traps in low-temperature polysilicon thin film transistors using a current transient method

A Drain–Source Connection Technique: Thermal Resistance Measurement Method for GaN HEMTs Using TSEP at High Voltage

Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device

Effect of Uniaxial Tensile Strains at Different Orientations on the Characteristics of AlGaN/GaN High-Electron-Mobility Transistors

Measuring Junction Temperature Inhomogeneity of Double-chip IGBT Modules by Electrical Method

Monitoring of defects creation sequence in 808 nm laser diode by reflectance analysis

Real-time measurement and control of junction temperature of VDMOS in power cycle test

The study of temperature-dependent degradation of optical output on 808 nm GaAs-Based High-Power Laser Diode Bars

A new method for detecting thermal characteristics of slow-wave structure of helix traveling-wave tube using external heat source

A New Method for Measuring Thermal Characteristics of Multistage Depressed Collectors

A voltage-transient method for characterizing traps in GaN HEMTs

Evidence of GaN HEMT Schottky Gate Degradation After Gamma Irradiation

Identifying the Traps in the Channel Region in GaN-based HEMTs Using a Nonmonotone Drain Current Transient

Junction Temperature Measurement Method for SiC Bipolar Junction Transistor Using Base-Collector Voltage Drop at Low Current

Photocurrents in GaN-based HEMTs: Theoretical model and experimental results

Temperature distribution measurement based on field-programmable gate array embedded ring oscillators

The thermal characterization of packaged semiconductor device