A current transient method for trap analysis in BiFeO3 thin films

Bipolar Resistive Switching Effect in BiFeO3/Nb:SrTiO3 Heterostructure by RF Sputtering at Room Temperature

Effect of post-deposition annealing pressure on bipolar resistive switching in RF sputtered BiFeO<inf>3</inf>/Nb:SrTiO<inf>3</inf> heterostructure

Effect of substrate thinning on the electronic transport characteristics of AlGaN/GaN HEMTs

Effect of two-dimensional electron gas on horizontal heat transfer in AlGaN/AlN/GaN heterojunction transistors

Evaluation of the Schottky Contact Degradation on the Temperature Transient Measurements in GaN HEMTs

Fatigue behavior of resistive switching in a BiFeO3 thin film

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Junction Temperature measurement of SiC BJT via the voltage drop of V<inf>BC</inf>

Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs

Temperature distribution measurement for chips based on FPGA

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

Influence of heat source size on thermal resistance of AlGaN/GaN HEMT

Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test

Rapid test method for thermal characteristics of semiconductor devices

Study of Heat Transport Behavior in GaN-Based Transistors by Schottky Characteristics Method

Analysis of the hybrid trapping effect in GaN HEMTS based on the current transient spectroscopy

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy

Thermal analysis in high power GaAs-based laser diodes

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

Degradation of the die attach layer in chip-on-board packaged light-emitting diodes during temperature cycling

Measuring temperature in GaN-based high electron mobility transistors by cathodoluminescence spectroscopy

Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

The research on temperature distribution of GaN-based blue laser diode

Thermal investigation of LED array with multiple packages based on the superposition method