Novel Semiconductor Devices and Reliability Lab
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Channel Temperature Measurement of AlGaN/GaN HEMTs by Forward Schottky Characteristics
2011
期刊
Chinese Physics Letters
作者
Guang-Chen Zhang
· Shi-Wei Feng
· Pei-Feng Hu
· Yan Zhao
· Chun-Sheng Guo
· Yang Xu
· Tang-Sheng Chen
· Yi-Jian Jiang
- 卷 28
- 期 1
- 页码 017201
- IOP Publishing
- ISSN: 0256-307X
- DOI: 10.1088/0256-307x/28/1/017201
