Novel Semiconductor Devices and Reliability Lab
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Effect of post-deposition annealing pressure on bipolar resistive switching in RF sputtered BiFeO<inf>3</inf>/Nb:SrTiO<inf>3</inf> heterostructure
2018
会议
2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
作者
Ying Yang
· Hui Zhu
· Xiao Meng
· Lei Jin
· Chen Wang
· Si Wang
· Shiwei Feng
· Chunsheng Guo
· Yamin Zhang
- IEEE
- ISBN: 9781538644409
- DOI: 10.1109/icsict.2018.8564947
