Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement - Novel Semiconductor Devices and Reliability Lab | LabXing

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Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

2017

期刊 Applied Physics Letters

作者 S. Y. Zhang · S. W. Feng · Y. M. Zhang · Z. F. An · H. W. Yang · X. He · X Wang · Y. B. Qiao

卷 110
期 22
页码 223503
AIP Publishing
ISSN: 0003-6951
DOI: 10.1063/1.4984598