Novel Semiconductor Devices and Reliability Lab
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B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy
2015
期刊
Microscopy
- 卷 64
- 期 suppl 1
- 页码 i93.1-i93
- Oxford University Press (OUP)
- ISSN: 2050-5698
- DOI: 10.1093/jmicro/dfv236
