Novel Semiconductor Devices and Reliability Lab
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Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures
2016
期刊
Applied Physics Letters
作者
Hui Zhu
· Yingqiao Zhang
· Anquan Jiang
· Zilong Bai
· Shiwei Feng
· Pengfei Wang
· Xiao Meng
· Qiong Qi
- 卷 109
- 期 25
- 页码 252901
- AIP Publishing
- ISSN: 0003-6951
- DOI: 10.1063/1.4972302
