联系我们
意见反馈

关注公众号

获得最新科研资讯

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

分享到

Bipolar Resistive Switching Effect in BiFeO3/Nb:SrTiO3 Heterostructure by RF Sputtering at Room Temperature

2018
期刊 Journal of Wuhan University of Technology-Mater. Sci. Ed.