Novel Semiconductor Devices and Reliability Lab
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Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs
2018
会议
2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)
- IEEE
- ISBN: 9781538662342
- DOI: 10.1109/edssc.2018.8487094
