Novel Semiconductor Devices and Reliability Lab
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Thermal analysis in high power GaAs-based laser diodes
2016
期刊
Journal of Semiconductors
- 卷 37
- 期 4
- 页码 044011
- IOP Publishing
- ISSN: 1674-4926
- DOI: 10.1088/1674-4926/37/4/044011
