A numerical calibration of structure-function transient thermal measurement based on Cauer RC network - Novel Semiconductor Devices and Reliability Lab | LabXing

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Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

2023

期刊 Microelectronics Journal

作者 Kun Bai · Shiwei Feng · Xuan Li · Shijie Pan · Xiaozhuang Lu · Zhihong Feng · Yamin Zhang

页码 105742
Elsevier BV
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2023.105742