Novel Semiconductor Devices and Reliability Lab
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Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors
2023
期刊
IEEE Transactions on Electron Devices
作者
Na Xie
· Hui Zhu
· Yiqun Zhang
· Zeng Huang
· Zhixuan Fang
· Zheng Liu
· Dong Li
· Shiwei Feng
· Chunsheng Guo
· Yamin Zhang
· Bo Liu
· Lixing Zhou
· Xing Liu
· Yerong Sun
· Zhirang Zhang
· Yilin Li
· Zhiwen Yao
- 卷 70
- 期 2
- 页码 544-549
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9383
- DOI: 10.1109/ted.2022.3231222
