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Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection
2023
期刊
IEEE Transactions on Instrumentation and Measurement
- 卷 72
- 页码 1-9
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9456
- DOI: 10.1109/tim.2023.3239625
