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A Trap Characterization System for GaN HEMTs Based on Transient Drain Voltage
2023
期刊
IEEE Transactions on Instrumentation and Measurement
作者
Shijie Pan
· Shiwei Feng
· Xuan Li
· Kun Bai
· Xiaozhuang Lu
· Xiang Zheng
· Zixuan Feng
· Yamin Zhang
- 页码 1-1
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9456
- DOI: 10.1109/tim.2023.3335518
