联系我们
意见反馈

关注公众号

获得最新科研资讯

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

分享到

Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device

2020
会议 2020 3rd International Conference on Electron Device and Mechanical Engineering (ICEDME)