Novel Semiconductor Devices and Reliability Lab
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Characterization of thermal-resistance in Ga2O3 Schottky barrier diodes with temperature-sensitive electrical parameters
2021
期刊
Semiconductor Science and Technology
作者
Xuan Li
· Shiwei Feng
· Zhihong Feng
· Yuanjie Lv
· Yuangang Wang
· Xin He
· Kun Bai
· Shijie Pan
- 卷 36
- 期 11
- 页码 115010
- IOP Publishing
- ISSN: 0268-1242
- DOI: 10.1088/1361-6641/ac1d23
