Novel Semiconductor Devices and Reliability Lab
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Junction Temperature Measurement Method for SiC Bipolar Junction Transistor Using Base-Collector Voltage Drop at Low Current
2019
期刊
IEEE Transactions on Power Electronics
作者
Bangbing Shi
· Shiwei Feng
· Yamin Zhang
· Kun Bai
· Yuxuan Xiao
· Lei Shi
· Hui Zhu
· Chunsheng Guo
- 页码 1-1
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0885-8993
- DOI: 10.1109/tpel.2019.2894346
