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Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

The research on temperature distribution of GaN-based blue laser diode

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Thermal investigation of LED array with multiple packages based on the superposition method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Measuring temperature in GaN-based high electron mobility transistors by cathodoluminescence spectroscopy

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Self-heating and traps effects on the drain transient response of AlGaN/GaN HEMTs

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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