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Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Study of Heat Transport Behavior in GaN-Based Transistors by Schottky Characteristics Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Degradation of the die attach layer in chip-on-board packaged light-emitting diodes during temperature cycling

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

The research on temperature distribution of GaN-based blue laser diode

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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