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Error correction of theory model in process-stress accelerated test

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A Method of Thermal Analysis for CMOS Integrated Circuit

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

The Augmented Lagrange Multiplier for robust visual tracking with sparse representation

远程医疗智能机器人 , 中国科学院大学

Denoising star map data via sparse representation and dictionary learning

远程医疗智能机器人 , 中国科学院大学

Robust Object Tracking Based on Structural Local Sparse Representation and Incremental Subspace Learning

远程医疗智能机器人 , 中国科学院大学

Modeling and simulation of Star Guidance System based on RT-LAB

远程医疗智能机器人 , 中国科学院大学

Multi-sensor Fusion Glass Detection for Robot Navigation and Mapping

远程医疗智能机器人 , 中国科学院大学

The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Thermal Fatigue Characteristics of Die Attach Materials for Packaged High-Brightness LEDs

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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