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The thermal characterization of packaged semiconductor device

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Error correction of theory model in process-stress accelerated test

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A Method of Thermal Analysis for CMOS Integrated Circuit

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Denoising star map data via sparse representation and dictionary learning

远程医疗智能机器人 , 中国科学院大学

Modeling and simulation of Star Guidance System based on RT-LAB

远程医疗智能机器人 , 中国科学院大学

Multi-sensor Fusion Glass Detection for Robot Navigation and Mapping

远程医疗智能机器人 , 中国科学院大学