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Superconducting gap symmetry in the superconductor BaFe1.9Ni0.1As2

关联电子材料的散射谱学 , 北京师范大学

Oxygen redox chemistry without excess alkali-metal ions in Na2/3[Mg0.28Mn0.72]O2

关联电子材料的散射谱学 , 北京师范大学

Anisotropic spin fluctuations in detwinned FeSe

关联电子材料的散射谱学 , 北京师范大学

Direct measurement of the temperature dependence of the magnetic penetration depth in Ba (Fe1− xNix) 2As2 superconductors

关联电子材料的散射谱学 , 北京师范大学

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Junction Temperature Measurement Method for SiC Bipolar Junction Transistor Using Base-Collector Voltage Drop at Low Current

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A voltage-transient method for characterizing traps in GaN HEMTs

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Junction Temperature measurement of SiC BJT via the voltage drop of V<inf>BC</inf>

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effect of post-deposition annealing pressure on bipolar resistive switching in RF sputtered BiFeO<inf>3</inf>/Nb:SrTiO<inf>3</inf> heterostructure

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Temperature distribution measurement for chips based on FPGA

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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