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Rapid test method for thermal characteristics of semiconductor devices

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Thermal analysis of multiple light sources based on the superposition method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Temperature distribution measurement based on field-programmable gate array embedded ring oscillators

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Analysis of the hybrid trapping effect in GaN HEMTS based on the current transient spectroscopy

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Measurement Deviation of the Virtual Junction Temperature by the Saturation Voltage Drop Method for Insulated-Gate Bipolar Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A protocol for Epon-embedding-based correlative super-resolution light and electron microscopy

付志飞实验室-超分辨光电关联成像 , 福建医科大学

Extending the spatiotemporal resolution of super-resolution microscopies using photomodulatable fluorescent proteins

付志飞实验室-超分辨光电关联成像 , 福建医科大学

mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM

付志飞实验室-超分辨光电关联成像 , 福建医科大学

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