简历详情

The study of temperature-dependent degradation of optical output on 808 nm GaAs-Based High-Power Laser Diode Bars

期刊: 2020 3rd International Conference on Electron Device and Mechanical Engineering (ICEDME)  2020
作者: Kun Bai,Xiang Zheng,Shiwei Feng,Tieying Hao
DOI:10.1109/icedme50972.2020.00033

Monitoring of defects creation sequence in 808 nm laser diode by reflectance analysis

期刊: Microelectronics Reliability  2020
作者: Kun Bai,Xiang Zheng,Shiwei Feng,Tieying Hao
DOI:10.1016/j.microrel.2020.113639