简历详情

Real-time measurement and control of junction temperature of VDMOS in power cycle test

期刊: 2020 3rd International Conference on Electron Device and Mechanical Engineering (ICEDME)  2020
作者: Shiwei Feng,Kun Bai,Hao Guo,Chunsheng Guo,Hang Wei
DOI:10.1109/icedme50972.2020.00159