简历详情
论文
Investigation of Charge Trapping Induced Trap Generation in Si FeFET With Ferroelectric Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sup>2</sup>
期刊: IEEE Transactions on Electron Devices 2024作者: Xinpei Jia,Junshuai Chai,Jiahui Duan,Xiaoqing Sun,Xianzhou Shao,Jinjuan Xiang,Kai Han,Yanrong Wang,Hao Xu,Xiaolei Wang,Jing Zhang,Wenwu Wang
DOI:10.1109/ted.2024.3351599
Depolarization Field in FeFET Considering Minor Loop Operation and Charge Trapping
期刊: IEEE Transactions on Electron Devices 2022作者: Wenwu Wang,Xiaolei Wang,Wenjun Liu,Hao Xu,Jinjuan Xiang,Xinpei Jia
DOI:10.1109/ted.2022.3161399
