铁电器件课题组（王晓磊）
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Experimental Investigation of Remote Coulomb Scattering on Mobility Degradation of Ge pMOSFET by Various PDA Ambiences
2019
期刊
IEEE Transactions on Electron Devices
作者
Lixing Zhou
· Xiaolei Wang
· Kai Han
· Xueli Ma
· Yanrong Wang
· Jinjuan Xiang
· Hong Yang
· Jing Zhang
· Chao Zhao
· Tianchun Ye
· Wenwu Wang
- 卷 66
- 期 4
- 页码 1669-1674
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9383
- DOI: 10.1109/ted.2019.2900801
