铁电器件课题组（王晓磊）
分享到
Electron mobility in silicon nanowires using nonlinear surface roughness scattering model
2020
期刊
Japanese Journal of Applied Physics
- 卷 59
- 期 3
- 页码 034002
- IOP Publishing
- ISSN: 0021-4922
- DOI: 10.35848/1347-4065/ab7722
