铁电器件课题组（王晓磊）
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Remote interfacial dipole scattering and electron mobility degradation in Ge field-effect transistors with GeOx/Al2O3gate dielectrics
2016
期刊
Journal of Physics D: Applied Physics
作者
Xiaolei Wang
· Jinjuan Xiang
· Shengkai Wang
· Wenwu Wang
· Chao Zhao
· Tianchun Ye
· Yuhua Xiong
· Jing Zhang
- 卷 49
- 期 25
- 页码 255104
- IOP Publishing
- ISSN: 0022-3727
- DOI: 10.1088/0022-3727/49/25/255104
