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Influence of temperature inhomogeneity and trap charge on current imbalance of SiC MOSFETs

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Nanoscale Silicon Fingerprints for Counterfeit Prevention in Microchips

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A Real-time Monitoring System for Power Consumption and Junction Temperature of DSP Devices

Novel Semiconductor Devices and Reliability Lab , 北京工业大学