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Online Temperature Measurement Method for SiC MOSFET Device Based on Gate Pulse
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
SiC MOSFET Trap Characterization Based on the Self-built Test Platform
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Cell Design Consideration in SiC Planar IGBT and Proposal of New SiC IGBT With Improved Performance Trade-Off
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Research on junction temperature of SiC MOSFET module
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Study of the Influence of Different Gate Oxide Traps on Threshold Voltage Drift of SiC MOSFET Based on Transient Current
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Corrigendum to “Implementing hardware primitives based on memristive spatiotemporal variability into cryptography applications” [Chip 2 (2023) 100040]
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Design and implementation of microcirculation cooling device for microelectronic devices based on electrostatic force
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Electrical Impedance Tomography for Thorax Image Using Connected Component Labeling and Sparse Group Lasso
东北师范大学梁士利课题组 , 东北师范大学
High‐performance Piezoelectric Two‐dimensional Covalent Organic Frameworks
Yang Yang Li group , 香港城市大学
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