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ZIF-derived N-doped carbon nanorods supporting bimetallic CoFe single-atoms/nanoclusters as bifunctional oxygen electrocatalysts for stable Zn-air batteries

Yang Yang Li group , 香港城市大学

A novel evaluation method to calibrate structural function

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Investigation of Electrical Characteristics and Trapping Effects in p-GaN Gate HEMTs Under Electron Irradiation

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Degradation analysis of GaN-based high–electron-mobility transistors under different stresses in semi-on state conditions

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Online Temperature Measurement Method for SiC MOSFET Device Based on Gate Pulse

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

SiC MOSFET Trap Characterization Based on the Self-built Test Platform

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Cell Design Consideration in SiC Planar IGBT and Proposal of New SiC IGBT With Improved Performance Trade-Off

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on junction temperature of SiC MOSFET module

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Study of the Influence of Different Gate Oxide Traps on Threshold Voltage Drift of SiC MOSFET Based on Transient Current

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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