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Degradation analysis of GaN-based high–electron-mobility transistors under different stresses in semi-on state conditions

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Online Temperature Measurement Method for SiC MOSFET Device Based on Gate Pulse

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Online optimization for net- worked distributed energy resources with time-coupling constraints

崔明建课题组 , 天津大学

Stability assessment of secondary frequency control system with dynamic false data injection attacks

崔明建课题组 , 天津大学

Dual timescales voltages regulation in distribution systems using data-driven and physics-based optimization

崔明建课题组 , 天津大学

Temperature-dependent resistance constrained PV accommodation capacity improvement based on multi-objective DRL

崔明建课题组 , 天津大学

ETDS: A novel electricity theft detection system for highly unbalanced data in smart grids

崔明建课题组 , 天津大学

SiC MOSFET Trap Characterization Based on the Self-built Test Platform

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Cell Design Consideration in SiC Planar IGBT and Proposal of New SiC IGBT With Improved Performance Trade-Off

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on junction temperature of SiC MOSFET module

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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