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Trap Characterization of Trench-Gate SiC MOSFETs based on Transient Drain Current

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors under Reverse Pulse Electrical Stress Using the Voltage-Transient Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Interactions between Elemental Selenium and Hydrophilic/Hydrophobic Surfaces: Direct Force Measurements Using AFM

表界面科学实验室 , 西南石油大学

A thermal boundary resistance measurement method based on a designed chip with the heat source separated from the temperature sensor

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Measuring Double-Sided Thermal Resistance of Press-Pack IGBT Modules Based on Ratio of Double-Sided Heat Dissipation

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Rhythm Mild‐Temperature Photothermal Therapy Enhancing Immunogenic Cell Death Response in Oral Squamous Cell Carcinoma

韩伟课题组 , 南京大学

Regulating tumor cholesterol microenvironment to enhance photoimmunotherapy in oral squamous cell carcinoma

韩伟课题组 , 南京大学

Visible-Light Paternò–Büchi Reaction for Lipidomic Profiling at Detailed Structure Levels

瑕瑜研究组-自由基生物质谱 , 清华大学

Wake-up effect in Hf<sub>0.4</sub>Zr<sub>0.6</sub>O<sub>2</sub> ferroelectric thin-film capacitors under a cycling electric field

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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