Whether “Rich in Frequency” Means “Rich in Information” in Pulsed Eddy Current Testing to Evaluate Plate Thickness: Numerical Investigation - 9号电磁无损检测实验室 | LabXing

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Whether “Rich in Frequency” Means “Rich in Information” in Pulsed Eddy Current Testing to Evaluate Plate Thickness: Numerical Investigation

2022

期刊 MATERIALS TRANSACTIONS

作者 Noritaka Yusa · Jiuhao Ge · Mengbao Fan

卷 63
期 4
页码 529-537
Japan Institute of Metals
ISSN: 1345-9678
DOI: 10.2320/matertrans.mt-i2021001